PhD students, Sophie Kinnear and David Perry, represented the group at the Microscience and Microscopy Congress last week. The conference covered all areas of microscopy from advanced functionality of AFM to the latest TEM and SEM techniques.

Both students gave talks about their work with SICM, Sophie discussed her project in using the technique for surface charge mapping and David, gave an insightful talk about using SICM in his newly developed bias modulation mode.