WMG has recently expanded its materials characterisation capability by buying a suite of new electron microscope based systems specifically configured for advanced high throughput analysis for solving a diverse range of applied engineering/materials problems. The capabilities of this equipment will be presented and how they fit into the larger portfolio of existing systems at the university will be explained.

The three main themes of the presentation are the ability to perform high sensitivity chemical analysis across the length scales, Focussed Ion Beam based tomography and the ability to perform ultra-high speed TEM studies.