Dr. Richard Morris

Biography

My area of expertise is within nano‑scale material development and analytical characterisation. I obtained my PhD from the University of Warwick, working on the development and optimisation of Ge channel heterostuctures to enhance their hole mobility for CMOS technology. In 2001 I secured a permanent research fellowship position based within the analytical Science projects (ASP) group. Here I have been working more exclusively on the application of secondary ion mass spectrometry (SIMS) at ultra low energies, developing new protocols that enable the analysis of various material types to be achieved. From my own research and working closely with collaborators, numerous journal publications and conference presentations have arisen. Further details and their references can be found from my publications record.

Research Interests and Activities

My current research involves the development of ultra low energy secondary ion mass spectrometry (uleSIMS) for the quantification of novel material systems. To date this has mainly focused on the depth profiling of nano-scale semiconductor structures e.g. group IV and III-V materials, but other areas of material research are now beginning to embrace the advantages that nano‑scale layers offer. More recently therefore, I have been working closely with colleagues at Imperial College to investigate thin (nanometre scale) ceramic multilayers for potential fuel cell applications. I am always keen to hear from researchers who may require SIMS analysis, want to learn more about what SIMS might offer them for their own research, or establish collaborations to work on developing innovative material structures, especially on the nanometre scale.

Another aspect of the SIMS technique that I am currently engaged with is mass spectral analysis. This is an area of research of which I am keen to develop further through a dynamic spectroscopy approach as many materials contain a wealth of information within their near surface (nanometre scale) region.

I am a member of the Institute of Physics (IoP) and serve on the committee for their Materials and Characterisation group.

Analytical (uleSIMS) Service

Aside from my own research I also run an analytical SIMS service. This provides SIMS analysis for both internal and external parties and is targeted towards aiding their research. My attitude is one that hopes to encourage and foster a collaborative relationship, an approach that has brought about numerous interdisciplinary project collaborations. I am also happy to train PhD students and PDRA’s in the operation of the Atomika SIMS tool where their group has a long term requirement. In the case of future grant applications (EPSRC/Other), I am always happy to be included.

I am also willing to quote for analysis of a commercial nature, offering both a professional and confidential service. For further information please contact me directly by phone (+44 (0) 2476 523871) or email (r.morris@warwick.ac.uk).

Brief introduction to the Analytical Science Projects (ASP) group

The Analytical Science Projects (ASP) group was originally formed in 1986 and was devoted towards developing SIMS instrumentation and analysis protocols for semiconductor layers. The group’s SIMS expertise and research has now diversified into other material systems while more recently we have expanded into other areas of analytical science, most notably synchrotron X‑ray analysis for cultural heritage studies. Further particulars and more detail can be found on the ASP group website.

Selected Publications

Below are a selection of publications covering my research activities. A full list of my publications can be found here: Publications list.

R.J.H. Morris, S. Fearn, J.M. Perkins, J. Kilner, M.G. Dowsett, M.D Biegalski & C.M. Rouleau. Surface and Interface Analysis, 43, 635‑638, (2011). “The use of low energy SIMS (LE‑SIMS) for nanoscale fuel cell material development”. DOI: 10.1002/sia.3526
Robert M. Cook, Lara-Jane Pegg, Sophie L. Kinnear, Oliver S. Hutter, Richard J.H. Morris & Ross A. Hatton. Advanced Energy Materials, 1, 440-447, (2011). “An Electrode Design Rule for Organic Photovoltaics Elucidated using molecular Nanolayers”. DOI: 10.1002/aenm.201100027
J. Lui, R.J. Chater, R.J.H. Morris & S. J. Skinner. Solid State Ionics, 189, 39-44, (2011). “Oxygen surface exchange and diffusion studies of La₂Mo₂O₉ in different exchange atmospheres”. DOI: 10.1016/j.ssi.2011.02.018
R.J.H. Morris, M.G. Dowsett, R. Beanland, P.J Parbrook & C.F. McConville. Rapid Communications in Mass Spectrometry. 24, 2122‑2126, (2010). “Optical conductivity enhancement (OCE) for accurate ultra low energy SIMS analysis of wide bandgap GaN/In_xGaN_1‑xstructures”. DOI: 10.1002/rcm.4623
J.M. Perkins, S. Fearn, S.N. Cook, R. Srinivasan, C.M. Rouleau, H.M. Christen, G.D. West, R.J.H. Morris, H.L. Fraser, S. J. Skinner, J.A. Kilner & D.W. McComb. Advanced Functional Materials, 20, 2664‑2674, (2010). “Anomalous oxidation states in oxide multilayers for fuel cell applications”. DOI: 10.1002/adfm.201000279
R.J.H. Morris & M.G. Dowsett. Journal of Applied Physics, 105, pp 114316. (2009). “Ion yields and erosion rates for Si_1‑xGe_x(0≤ x ≤1) ultra low energy O₂⁺ SIMS in the energy range 0.25-1 keV”. DOI: 10.1063/1.3139279
R.J.H Morris, M.G Dowsett, S.H Dalal, D.L Baptista, K.B.K Teo & W.I Milne. Surface and Interface Analysis, 39, 898‑901, (2007). “Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis”. DOI: 10.1002/sia.2610
R.J.H Morris, D.R Leadley, R Hammond, T.J Grasby, T.W Whall & E.H.C Parker. Journal of Applied Physics, 96, 6470. (2004). “Influence of re‑growth conditions on the hole mobility in strained Ge heterostructures produced by hybrid‑epitaxy”. DOI: 10.1063/1.1811784