Staunton R C
IEE Electronics Letters, vol 33, no 24, 1997, 2031-2032.
Edge detector tests using edges derived from the acquisition system's edge spread function are described. The test edges represent the most difficult that would exist in a practical system. The results were significantly different to those obtained by traditional methods indicating that simpler detectors may suffice for some applications.
Key Terms: Edge detector accuracy, Edge model, Transfer function, CCD Camera.